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A new experimental method (E-plot) to characterize the substrate-current and the saturation-voltage of fresh and hot-electron-damaged NMOSFETs

✍ Scribed by Shi-Ho Kim; Kyeong-Sik Min; Kwyro Lee


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
177 KB
Volume
37
Category
Article
ISSN
0038-1101

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