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A new dynamic gate capacitance measurement protocol to evaluate integrated high-voltage devices' switching loss performances in power management applications

✍ Scribed by Grelu, C.; Baboux, N.; Bianchi, R.A.; Plossu, C.


Book ID
114618035
Publisher
IEEE
Year
2005
Tongue
English
Weight
661 KB
Volume
52
Category
Article
ISSN
0018-9383

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