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A new diffraction method for the determination of the effective depth of X-Ray penetration

✍ Scribed by Tomov, I.

Publisher: John Wiley and Sons
Year: 1986
Tongue: English
Weight: 472 KB
Volume: 95
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210950205

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