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A new diagnostic tool for the non-destructive characterization of damage accompanying the electromagnetic breakdown of epitaxial silicon p-n junctions

✍ Scribed by M. Dudley; G. Tolis; D. Gordon-Smith; C. Fazi


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
779 KB
Volume
15
Category
Article
ISSN
0921-5107

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