๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A new data acquisition method for measuring dentitions and tests for accuracy

โœ Scribed by B. S. Savara; Carlos Sanin


Publisher
John Wiley and Sons
Year
1969
Tongue
English
Weight
253 KB
Volume
30
Category
Article
ISSN
0002-9483

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Electrostatic discharge failure factor o
โœ Kouichi Suzuki; Tetsuo Muranoi; Manabu Takeuchi ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 276 KB ๐Ÿ‘ 2 views

The electrostatic discharge (ESD) sensitivities of highly refined ULSIs should be evaluated by a test method based on the direct-charging charged device model (D-CDM) or the field-induced charged device model (F-CDM). The CDM features nanosecond transient response and high peak current, as compared