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A new computer program for Rietveld analysis of X-ray powder diffraction patterns

✍ Scribed by Wiles, D. B. ;Young, R. A.


Book ID
114499276
Publisher
International Union of Crystallography
Year
1981
Tongue
English
Weight
339 KB
Volume
14
Category
Article
ISSN
0021-8898

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## Abstract Least‐square refinement of x‐ray powder diffraction patterns analyzed by the Rietveld method can yield structural information which had been unattainable or at least elaborate to obtain by conventional pattern analysis. The Rietveld method calculates a powder pattern on the basis of a s