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A new computer method of image analysis applied to semiconductor's structural characterization

✍ Scribed by M.A. Hernández-Fenollosa; D. Cuesta-Frau; L.C. Damonte; P. Micó-Tormos

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 678 KB
Volume: 389
Category: Article
ISSN: 0921-4526
DOI: 10.1016/j.physb.2006.07.029

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