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A New Built-In Defect-Based Testing Technique to Achieve Zero Defects in the Automotive Environment

✍ Scribed by Vezio Malandruccolo; Mauro Ciappa; Hubert Rothleitner; Wolfgang Fichtner

Book ID: 106384501
Publisher: Springer US
Year: 2010
Tongue: English
Weight: 610 KB
Volume: 27
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-010-5178-3

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