A new boron implantation model suitable for analytical modeling of threshold voltage of MOSFETS : A. Das Gupta and S. K. Lahiri. Solid-St. Electron.30, 1283 (1987)

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 123 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90484-8