A new approach to reliability prediction : W. K. Chung and W. C. Chan. IEEE Trans. Reliab.R-23, 252 (1974)

• Book ID: 103272407
• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 130 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90485-0