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A New Approach to Phase Selection Using Fault Generated High Frequency Noise and Neural Networks

✍ Scribed by Bo, Z.Q.; Aggarwal, R.K.; Johos, A.T.; Li, H.Y.; Song, Y.H.

Book ID: 117901520
Publisher: IEEE
Year: 1997
Tongue: English
Weight: 142 KB
Volume: 17
Category: Article
ISSN: 0272-1724
DOI: 10.1109/mper.1997.560669

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