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A new approach to pH of point of zero charge measurement: crystal-face specificity by scanning force microscopy (SFM)

✍ Scribed by CarrickM. Eggleston; Guntram Jordan


Book ID
117118138
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
284 KB
Volume
62
Category
Article
ISSN
0016-7037

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