A new approach to measure ion reflection and secondary ion emission during ion bombardment of atomically clean and smooth monocrystalline metal surfaces

✍ Scribed by E.P.Th.M. Suurmeijer; A.L. Boers; S.H.A. Begemann

• Book ID: 118980032
• Publisher: Elsevier Science
• Year: 1970
• Tongue: English
• Weight: 304 KB
• Volume: 20
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(70)90194-9