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A new approach for SPICE simulation of AlGaAs/GaAs HBT subjected to burn-in test

✍ Scribed by Sheu, S.; Liou, J.J.; Huang, C.I.


Book ID
114537193
Publisher
IEEE
Year
1998
Tongue
English
Weight
146 KB
Volume
45
Category
Article
ISSN
0018-9383

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