✦ LIBER ✦
A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal
✍ Scribed by Kanyogoro, Nderitu; Buchner, Stephen; McMorrow, Dale; Hughes, Harold; Liu, Michael S.; Hurst, Al; Carpasso, Charles
- Book ID
- 120586233
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 376 KB
- Category
- Article
- ISSN
- 0018-9499
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