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A new approach for extracting phase effect based on in-line X-ray phase imaging

โœ Scribed by Xia, Tian; Ma, Junshan; Zhang, Xuelong; Cheng, Jinghai; Peng, Weijun; Yao, Xufeng


Book ID
125351357
Publisher
Optical Society of Japan
Year
2014
Tongue
English
Weight
813 KB
Volume
21
Category
Article
ISSN
1340-6000

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