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A new and simple probe-based method for preventing charging in focused-ion-beam micro-sampling

✍ Scribed by Muneyuki Fukuda; Satoshi Tomimatsu; Hiroyasu Shichi; Kaoru Umemura


Book ID
108207391
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
270 KB
Volume
78-79
Category
Article
ISSN
0167-9317

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