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A negative Vth cell architecture for highly scalable, excellently noise-immune, and highly reliable NAND flash memories

✍ Scribed by Takeuchi, K.; Satoh, S.; Tanaka, T.; Imamiya, K.; Sakui, K.


Book ID
119775355
Publisher
IEEE
Year
1999
Tongue
English
Weight
397 KB
Volume
34
Category
Article
ISSN
0018-9200

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