A negative drain conductance property in a super-thin film buried-channel MOSFET on a buried insulator

✍ Scribed by Omura, Y.; Sano, E.; Ohwada, K.

• Book ID: 114594343
• Publisher: IEEE
• Year: 1983
• Tongue: English
• Weight: 669 KB
• Volume: 30
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1983.21074