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A nanoscale characterisation of extended defects in glassy-like As2Se3 semiconductors with PAL technique

✍ Scribed by O. Shpotyuk; A. Kovalskiy; J. Filipecki; M. Hyla; A. Kozdras


Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
195 KB
Volume
340-342
Category
Article
ISSN
0921-4526

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