A nanoanalytical investigation of the Ga2O3/GaGdO dielectric gate stack for InGaAs based MOSFET devices

✍ Scribed by P. Longo; G.W. Paterson; M.C. Holland; I.G. Thayne; A.J. Craven

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 463 KB
• Volume: 86
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2009.03.131