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A multiple-reflexion ellipsometric method for the study of electrochemical processes

✍ Scribed by S. Minc; R. Mierzecki

Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
129 KB
Volume
18
Category
Article
ISSN
0013-4686

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✦ Synopsis

Ah&act--The possibility of applying multiplereflection ellipsometric measurements to the study of electrochemical processes occurring at a metal/electrolyte solution interface is discussed. Use is made of the relation between the 4 and 6 parameters of elliptically polarized light after a single reflexion by a metal surface and the 6 and A parameters after repeated reflexions, for hare metal surfaces and those covered by a dielectric.

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