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A multiple pin, flip-chip system for microwave and gigabit per second cryogenic device testing at variable temperatures

✍ Scribed by Wire, M. S.; Durand, D. J.; Silver, A. H.; Wagner, M. K.; Hamilton, C. A.


Book ID
118277661
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
697 KB
Volume
72
Category
Article
ISSN
0034-6748

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