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A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing

✍ Scribed by E.S. Sogomonyan; A.D. Singh; M. Goessel

Book ID: 110262183
Publisher: Springer US
Year: 1999
Tongue: English
Weight: 81 KB
Volume: 15
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1008328101088

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