✦ LIBER ✦
A multi-defect initialization-based percolation model: a successful scheme to explain dielectric breakdown in MOS devices
✍ Scribed by R.P dos Santos; F.V.J Nobre; U.M.S Costa; V.N Freire; M.L Lyra; E.F da Silva Jr.
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 78 KB
- Volume
- 17
- Category
- Article
- ISSN
- 1386-9477
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