In the x-ray microÑuorescence analysis of particles, the characteristic line intensity depends not only on the chemical composition of the sample, but also on the x-ray beam proÐle, particle size, shape and orientation. In previous work, optical measurements of particle dimensions were required to d
✦ LIBER ✦
A Monte Carlo Program for Quantitative Electron-Induced X-ray Analysis of Individual Particles
✍ Scribed by Ro, Chul-Un; Osán, János; Szalóki, Imre; de Hoog, Johan; Worobiec, Anna; Grieken, René Van
- Book ID
- 111862716
- Publisher
- American Chemical Society
- Year
- 2003
- Tongue
- English
- Weight
- 196 KB
- Volume
- 75
- Category
- Article
- ISSN
- 0003-2700
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## Abstract When thin overlayers on a bulk material have to be analysed by EPMA (electron probe microanalysis) or AES (Auger electron spectroscopy), the signal obtained is enhanced by three factors: (i) back‐scattering, (ii) characteristic x‐rays induced in the bulk by the primary beam and (iii) co