A modified reliability expression for the electromigration time-to-failure : A. Bobbio and O. Saracco. Microelectron. and Reliab.14, 431 (1975)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 124 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90395-4