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A model to monitor the current gain long-term instability in AlGaAs/GaAs HBTs based on noise and leakage current characteristics

✍ Scribed by J.J. Liou; C.I. Huang; J. Barrette


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
502 KB
Volume
38
Category
Article
ISSN
0038-1101

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