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A model to describe the humplike feature observed in the accumulation branch of capacitance-voltage characteristics of MOS capacitors with oxide-hosted silicon nanoparticles

✍ Scribed by V. A. Stuchinsky, G. N. Kamaev, M. D. Efremov, S. A. Arzhannikova


Book ID
119884889
Publisher
SP MAIK Nauka/Interperiodica
Year
2012
Tongue
English
Weight
178 KB
Volume
38
Category
Article
ISSN
1063-7850

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