✦ LIBER ✦
A model for the failure of bipolar silicon integrated circuits subjected to electrostatic discharge : T. S. Speakman. Proc. IEEE Reliab. Phys. Symp. 60 (1974)
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 138 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
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