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A mode projecting method for the quasi-static analysis of electrooptic device electrodes considering finite metallization thickness and anisotropic substrate
✍ Scribed by Jin, H.; Vahldieck, R.; Belanger, M.; Jacubczyk, Z.
- Book ID
- 117870026
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 735 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0018-9197
- DOI
- 10.1109/3.97274
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