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A Microwave Method for Accurate and Stable Retrieval of Constitutive Parameters of Low- and Medium-Loss Materials

✍ Scribed by Hasar, U.C.


Book ID
118139065
Publisher
IEEE
Year
2010
Tongue
English
Weight
136 KB
Volume
20
Category
Article
ISSN
1531-1309

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## Abstract A free‐space method for the measurement of biaxial material is proposed in this paper. Four complex transverse constitutive parameters are directly computed from the reflection and transmission coefficients of a planar sample in free space for the normally incident plane wave with two p