𝔖 Bobbio Scriptorium
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A microwave measurement technique for characterizing the I-V relationship for negative differential conductance devices

✍ Scribed by Huang, P.; Pan, D.S.; Luhmann, N.C., Jr.


Book ID
114551624
Publisher
IEEE
Year
1993
Tongue
English
Weight
452 KB
Volume
41
Category
Article
ISSN
0018-9480

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