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A microprocessor controlled eddy current tester and its influence on defect testing : Proceedings of the 9th Congress of materials testing, Budapest (Hungary), 29 Sep. – 3 Oct. 1986. Vol. 2. pp. 614–615. Edited by E. Czoboly. Scientific Society of Mechanical Engineers (1986)

✍ Scribed by G. Huschelrath

Publisher: Elsevier Science
Year: 1989
Weight: 150 KB
Volume: 22
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(89)90123-5

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