A microchannel plate system for accelerator mass spectrometry measurements
β Scribed by C. Cetina; D.L. Knies; K.S. Grabowski; M. Getaneh; S.J. Tumey; R. Raffanti; O.H.W. Siegmund; J.V. Vallerga
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 181 KB
- Volume
- 513
- Category
- Article
- ISSN
- 0168-9002
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β¦ Synopsis
The position-sensitive focal plane detector system for the trace element accelerator mass spectrometer at the US Naval Research Laboratory consists of 12 microchannel plate detector modules. Each module provides a 10 Γ 2 cm 2 active area and together they cover 80% of the split-pole spectrograph focal plane. The MCP detects electrons produced when an MeV ion beam passes through a thin carbon foil placed at 45 with respect to the beam. The electric charge is amplified and deposited on a double-delay line anode, with differential timing at the two ends providing horizontal position. Vertical position is evaluated from top-to-bottom charge partitioning. The collected charge is converted to timing signals through specially designed readout electronics based on the MQT300A LeCroy integrated circuit. A 400-mm horizontal resolution was obtained from ion beam generated secondary electrons accelerated to 2.5 keV. A Helmholtz-type coil pair was built for further confining the secondary electrons with a magnetic field.
π SIMILAR VOLUMES
Pointlike ion sources allow the application of gridless acceleration systems in time-of-flight mass spectrometry (TOF/MS). When ions are extracted from large sample areas according to the applied ionization method and sample geometry, the application of electrostatic lenses for acceleration seems to