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A metrology perspective on the dark injection transient current method for charge mobility determination in organic semiconductors

✍ Scribed by Esward, T.; Knox, S.; Jones, H.; Brewer, P.; Murphy, C.; Wright, L.; Williams, J.


Book ID
126064373
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
748 KB
Volume
109
Category
Article
ISSN
0021-8979

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