𝔖 Bobbio Scriptorium

✦ LIBER ✦

A metrological scanning force microscope used for coating thickness and other topographical measurements

✍ Scribed by Bienias, M.; Gao, S.; Hasche, K.; Seemann, R.; Thiele, K.

Book ID: 113035362
Publisher: Springer
Year: 1998
Tongue: English
Weight: 783 KB
Volume: 66
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390051252

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