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A method to significantly lessen the sample contamination of the vacuum interface of an on-axis electrospray ion source by adding a mechanical shutter

✍ Scribed by Jan Axelsson; Kristina Håkansson; Magnus Palmblad; Per Håkansson


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
17 KB
Volume
13
Category
Article
ISSN
0951-4198

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✦ Synopsis


A method to significantly lessen the sample contamination of the vacuum interface of an on-axis electrospray ion source by adding a mechanical shutter