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A method of yield analysis for analog–integrated circuits using spherical surface random numbers

✍ Scribed by Yoichi Jyo; Hiroshi Ikeda; Suemitsu Minamoto; Yoshiaki Kojima

Book ID: 112075618
Publisher: John Wiley and Sons
Year: 1987
Tongue: English
Weight: 493 KB
Volume: 70
Category: Article
ISSN: 8756-6621
DOI: 10.1002/ecja.4410701203

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