✦ LIBER ✦
A method of eliminating B-mode dielectric breakdown failure in gate oxides utilizing a charging phenomenon
✍ Scribed by Ajioka, T.; Nara, A.; Tominaga, Y.; Ushikoshi, T.; Kitabayashi, H.
- Book ID
- 114535472
- Publisher
- IEEE
- Year
- 1993
- Tongue
- English
- Weight
- 513 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0018-9383
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