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A method for the measurement of the turn-on condition in MOS transistors

✍ Scribed by H. Wallinga

Publisher
Elsevier Science
Year
1971
Tongue
English
Weight
426 KB
Volume
14
Category
Article
ISSN
0038-1101

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The conditioned head turn procedure as a
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The purpose of this paper is to present and describe the Conditioned Head Turn procedure, with primary focus on its use as a method for testing infant speech perception. The paper begins with a brief history of the Conditioned Head Turn Procedure followed by a fairly detailed description of how the