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A method for pseudo-exhaustive test pattern generation

✍ Scribed by Kagaris, D.; Makedon, F.; Tragoudas, S.

Book ID: 119777807
Publisher: IEEE
Year: 1994
Tongue: English
Weight: 926 KB
Volume: 13
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.310906

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