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A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films

✍ Scribed by N. Hasegawa; K. Hono; R. Okano; H. Fujimori; T. Sakurai

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 610 KB
Volume: 67
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(93)90345-c

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