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A method for MOSFET parameter extraction at very low temperature

✍ Scribed by Gerard Ghibaudo; Francis Balestra

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 221 KB
Volume: 32
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(89)90095-6

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