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A method for measuring the energy loss of 92 keV 237Np ions in traversing thin films

โœ Scribed by D.A. Ambrosi; J.L. Wolfson


Publisher
Elsevier Science
Year
1969
Weight
295 KB
Volume
74
Category
Article
ISSN
0029-554X

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## Abstract Understanding the complex interplay between the 3D structural hierarchy within thin films of conjugated polymers and the properties of devices based thereon is starting to be recognized as an important challenge in the continued development of these materials for a range of applications