A method for grouping thyristors according to reliability using low-frequency noise and X-ray radiation

✍ Scribed by M. I. Gorlov; D. Yu. Smirnov; E. A. Zolotareva

• Book ID: 110210408
• Publisher: SP MAIK Nauka/Interperiodica
• Year: 2010
• Tongue: English
• Weight: 134 KB
• Volume: 46
• Category: Article
• ISSN: 1061-8309
• DOI: 10.1134/s1061830910120028