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A method based on optical and atomic force microscopes for instant imaging of non-homogeneous electro-mechanical processes and direct estimation of dij coefficients in piezoelectric materials at the local level

✍ Scribed by Stamopoulos, D.; Zhang, S.J.


Book ID
124136733
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
729 KB
Volume
612
Category
Article
ISSN
0925-8388

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