A measurement technique of time-dependent dielectric breakdown in MOS capacitors : Seung P. Li. Microelectron. & Reliab.13, 209 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 117 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90338-8