A Measurement Process to Characterize Natural and Engineered Low-Loss Uniaxial Dielectric Materials at Microwave Frequencies

✍ Scribed by Mumcu, G.; Sertel, K.; Volakis, J.L.

• Book ID: 114660885
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 627 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.2007.912168