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A lumped model analysis of noise in semiconductor devices

✍ Scribed by Beatie, R.N.


Book ID
118696996
Publisher
Institute of Electrical and Electronics Engineers
Year
1959
Tongue
English
Weight
650 KB
Volume
6
Category
Article
ISSN
0096-2430

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A lumped-distributed small-signal model
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## Abstract In this paper a new lumped‐distributed small‐signal and noise model is presented for a class of transit‐time semiconductor devices including the IMPATT, BARITT, Transferred Electron and Space Charge Limited (SCL) diodes. The assumption of uniform carrier velocity is made and diffusion i